Name SHENG-TSAING TSENG

Title Professor
Office Room 830, General Building III
Tel 886-3-5730772
Fax 886-3-5728318
E-mail sttseng@stat.nthu.edu.tw

 

EDUCATION
     Post Doc. Statistics Stanford University 1984-1985
     Ph. D. Management Sciences Tamkang University 1979-1982

M. Sc.       

Applied Mathematics Tsing-Hua University 1975-1977

B. Sc.       

Business Mathematics Soochow University 1971-1975

 

PROFESSIONAL EXPERIENCES
     Professor National Tsing-Hua University 1995/8 ~
     Professor National Taiwan Institute of Technology 1989/8-1995/7

Associate Professor        

National Taiwan Institute of Technology 1982/8-1989/7

Lecturer        

Soochow University 1977/8-1982/7

 

RESEARCH INTERESTS

Reliability Analysis

SPC and Run-to-run Process Control

Design of Experiment (DOE) and Taguchi Method

 

HONORS AND AWARDS

Outstanding Research Award, NSC of Taiwan (1993-1995, 1999-2001, 2004-2007)

Excellent Teaching Award, MOE of Taiwan (1993)

 

PROFESSIONAL ACTIVITIES

Associate Editor

Statistica Sinica 1996/8-1999/12

Associate Editor

IEEE Transactions on Reliability 2001/1-2005/6

Associate Editor

IEEE Transactions on Reliability 1993/8-1996/12

Editor-in Chief

J. of Chinese Inst. of Ind. Eng. 1991/1-1992/12
     ISI elected member, ASQ member, IEEE member  

 

PUBLICATIONS
     Journal Papers
  1. Tseng, S. T. and Tsung, F. and Liu, P-Y. (2006), “Variable EWMA run-to-run controller for a drift process.” To appear in IIE Transactions.

  2. Tseng, S. T. and Peng, C. Y. (2006), “Stochastic diffusion modeling of degradation data.” To appear in Journal of Data Science.

  3. Liao, C. M. and Tseng, S. T.* (2006), “Optimal design for step-stress accelerated degradation tests.” IEEE Transactions on Reliability, 55(1), 59-66, NSC 87-2218-M-007-007, (SCI).

  4. Tseng, S. T.*, Song, W. M., and Chang, Y. C. (2005), An enhanced double EWMA control scheme. To appear in IEEE Transactions on Semiconductor Manufacturing. NSC 89-2218-M-007-018, (SCI).

  5. Tseng, S. T. and Hsu, N. J. (2005), "Sample size determination for achieving the asymptotically stability of double EWMA controller." IEEE Transactions on Semiconductor Manufacturing, 18(1), 104-111, NSC 92-2213-E-007-066.

  6. Tseng, S. T.* and Peng, C. Y. (2004), Optimal burn-in policy by using integrated Wiener process, IIE Transactions (Focus on Quality and Reliability Engineering), 36, 1161-1170, NSC 91-2213-E-007-081, (SCI).

  7. 曾勝滄*、彭健育及劉家銘 (2004), 「非線性隨機衰變模型之最適設計」, 中國統計學報第 42 卷第2期,頁數 115-130, (Invited paper on the celebration of Dr. M. T. Chao's retirement).

  8. Yu, H. F. and Tseng, S. T.* (2004), Designing degradation experiment with a reciprocal Weibull degradation Rate, Journal of Quality Technology and Quantitative Methods, 1(1), 47-63.

  9. Tseng, S, T.*, Yeh, A. B., Tsung, F., Chan, I. Y. (2003), A study of variable EWMA controller. IEEE Transactions on Semiconductor Manufacturing, 16(4), 633-643. NSC 90-2218-M-007-009, (SCI).

  10. Tseng, S. T.*, Tang, J., and Ku, I. H. (2003), "Determination of burn-in parameters and residual life assessment of highly reliable products." Naval Research Logistics, 50(1), 1-14. NSC-87-2213-007-053, (SCI).

  11. Tseng, S. T.*, Chou, R. J., and Lee, S. P. (2002a), "A study of multivariate EWMA controller." IIE Transactions, 34(6), 541-549, NSC 88-2218-M-007-007, (SCI).

  12. Tseng, S. T.*, Chou, R. J., and Lee, S. P. (2002b), "Statistical design of double EWMA controller." Applied Stochastic Models in Business and Industry, 18(3), 313-322. NSC 89-2218-M-007-018, (SCI).

  13. Yu, H. F., and Tseng, S. T.* (2002), "Designing a screening experiment for highly reliable products." Naval Research Logistics, 49(5), 514-526, NSC 89-2218-M-007-019, (SCI).

  14. Tseng, S. T.*, and Tang, J. (2001), "Optimal burn-in time for highly reliable products." International Journal of Industrial Engineering, 8(4), 329-338, NSC-87-2213-007-053, (SCI).

  15. Tseng, S. T.*, and Wen, Z. C. (2000), "Step-stress accelerated degradation analysis of highly reliable products." Journal of Quality of Technology, 32(3), 209-216. NSC 87-2218-M-007-007, (SCI).

  16. Yeh, R. H., Ho,W. D., and Tseng, S. T.* (2000), "Optimal production run length for products sold with warranty." European Journal of Operational Research, 120(3), 575-582, (SCI).

     Conference Papers
  1. Tseng, S. T. (2005), “Determination the Sample Size for Achieving Stability of Double MEWMA Controller,” CSPS and IMS Joint Meeting, Beijing, July 9-12.

  2. Tseng, S. T. (2004), "Reliability Improvement via Degradation Experiment," MMR2004 Conference, Santa Fe, USA, June 21-24.

  3. Tseng, S. T. (2003), "An Enhanced Double EWMA Control Scheme," 54nd ISI International Conference, Berlin, Germany, August 13-20.

  4. Tseng, S. T. (2003), "Optimal Variable EWMA Controller for a Drifted Process," 3nd International Symposium of Industrial Statistics, Barcelona, Spain, August 21-22.

  5. Tseng, S. T. and Peng, C. Y. (2002), "Optimal burn-in time via stochastic integral" International Conference on Ranking and Selection, Multiple Comparisons, Reliability, and their Applications, Chennai, India, Dec. 28-30.

  6. Yu, H. F. and Tseng, S. T.(2001), "Designing a screening experiment for highly reliable products," ISI International Conference, Seoul, Korea, August 23-28.

  7. Tseng, S. T., Chou, R. J. and Lee, S. P. (2001), "Stability analysis of double EWMA controller," 2nd International Symposium of Industrial Statistics, Yokoyama, Japan, August,20-21.

  8. Sun, C. I., Lee, S. P., Tseng, S. T., and Lo, Y. C. (2001), "Run by run feedback control for multiple products and multiple tools," 2nd International Symposium Industrial Statistics, Yokoyama, Japan, August,20-21.

  9. Tseng, S. T. (2000), "Optimal burn-in procedure for highly-reliable products," 2nd International Conference of Mathematical methods of Reliability Theory, Bordeaux, France.

     Technical Reports
  1. 曾勝滄(2005)。「非線性衰變模型之研究」(1/3),國科會研究計劃 (NSC 93-2118-M-007-008)

  2. Tseng, S. T. and Peng, C. Y. (2004). “A stochastic diffusion model for LED accelerated degradation data.” Submitted for publication.

  3. Yang, M. C., Lee, J. Y., Chan, Y. Y. and Tseng, S. T. (2003), “Manufacturing a semiconductor wafer according to the process time by process tool,” US Patent: 6514861, International Class: H01L021/302, February 4, 2003.

  4. 曾勝滄(2003)。「Double EWMA 控制器穩定性質之研究」(1/3),國科會研究計劃 (NSC 92-2213-E-007-066)

  5. 曾勝滄(2003)。「變動折扣因子控制器之研究」(3/3),國科會研究計劃 (NSC 92-2218-M-007-010)

  6. 楊明城、李俊毅、詹韻玉、曾勝滄 (2002),「半導體製程」,中華民國專利證書發明第 181901 號,專利權期限 (民國927~1155)

  7. 曾勝滄(2002)。「應用隨機積 分決定高可靠度產品之最適Burn-in時間之研究」,國科會研究計劃成果報告 (NSC 91-2213-E-007-081)

  8. 曾勝滄(2002)。「變動折扣因子控制器之研究」(2/3),國科會研究計劃成果報告 (NSC 91-2218-M-007-002)

  9. 曾勝滄(2001)。「高可靠度產品之壽命改善研究」(3/3),國科會研究計劃成果報告 (NSC 89-2218-M-007-019)

  10. 曾勝滄(2001)。「變動折扣因子控制器之研究」(1/3),國科會研究計劃成果報告 (NSC 90-2218-M-007-009)

  11. 曾勝滄(2000)。「Double EWMA 控制器之統計分析」(2/2),國科會研究計劃成果報告 (NSC 89-2218-M-007-018)

  12. 曾勝滄(2000)。「高可靠度產品之壽命改善研究」(2/3),國科會研究計劃成果報告 (NSC 89-2218-M-007-005)